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LTESPA-V248N m, 190kHz, 4 Sided Tip, Al Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality long lever etched silicon probes for TappingMode and other non contact modes. Unmounted for use on standard AFM's. Bruker AFM Probes has introduced an improved version of its popular, LTESP LTESPA AFM probes. Brukers new line of LTESP high quality premium etched silicon probes set the industry standard for long

Cantilever Material: Diamond nmech probe

8N/m Cantilever Thickness (Nom): 3 Cantilever Thickness (RNG): 2

This model offers 100nm tall cylindrical shaped pillar tips with 20nm base diameter

The EBD-CDR probes for 3D reference and hybrid metrology: witha full range of EBD-CDR probes from 130 nm down to 15 nm

Includes a subset of PeakForce QNM samples

Replaces model STR10-1800P

Bruker AFM Probes has introduced an improved version of its popular MLCT AFM probes

Bruker's SCM-PIC-V2 probe has a Platinum-Iridium coated

Max W = 32 nm

or CAT-PFQNM)

Movie playback speed 9x

PeakForce Tapping Hi-Res Fluid Probe B