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Multi Holder for 6 Pin StubsDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain

Dimensions: 75 x 65 x 7

Using this probe on an AFM other than the Dimension FastScan is not recommended and will result in sub-optimal performance

glow discharge and plasma cleaning

parallel cutting tweezers for soft copper

1µm for the 50µm and 2µm patterns

and a magnetic moment of 1e-13 EMU (medium)

MFM starter kit for Dimension series SPMs

3º total included angle

5nm Square size: 1

Why XYZ Calibration Nanogrid

Fine Tip 7 130mm PEEK 0

They are also useful for repairs and adjustments on microscopes and other instrumentation