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Large Bulk Specimen HolderDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain

Holes 45µm square

Enjoy up to 20X faster survey scan rates and up to 6X faster scans with no loss of resolution

55 Cantilever Geometry: Rectangular Cantilevers Number: 1 Back Side Coating: Reflective Aluminum

000 lines/mm in both directions

platinum conversion plate and conductive plastic

MTM-10 thickness monitor unit for precise and reproducible coating thickness

Every aspect of the MPP design has been optimized to provide the most accurate profiling of microscopic features

wear-resistant and non-conductive (both thermally and electrically)

- Use TERS-SMPL to test these probes at 633 nm excitation

6-Diamidino-2-phenylindole Dihydrochloride:Hydrate

stainless steel and 2-56 x 3/16 pan head

heavy duty cleansing agent