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Description

DDLTESP-V2DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Brukers new series of conductive diamond coated probes provide consistent performance with high wear resistance in mechanical and electrical applications. In mechanical applications, these probes provide extreme wear resistance. On a Bruker Dimension Icon with FASTForce Volume Contact Resonance, these probes provide consistent results over many dozens of images. In electrical applications, these

Recommended for use with Bruker Dimension FastScan AFM

and contact mode

the MPP is the industry standard for high-performance and high-quality imaging on a wide variety of sample types

B-doped on a p-type substrate

Tip Geometry: Critical Dimension (Overhang) Tip Height: 10 - 20 Tip Coating: Amorphous Carbon Tip Set Back( RNG): 5 - 15

Tappingmode

5+/-5 Tip Radius (Nom): 20 Tip Coating: Highly conductive single cystal diamond Tip Set Back (Nom): 15-25 Tilt Compensation: 0 +/- 1

25 Cantilever Thickness (RNG): 0

Bruker's BioScope Resolve™ BioAFM features the highest resolution atomic force microscopy imaging and most complete cell mechanics capabilities available for use with an inverted optical microscope

Recommended for use with any PeakForce Tapping enabled Bruker AFM

A pack of 10 High quality long-lever etched silicon probes for TappingMode™ and other non-contact modes

No Reflective Coating

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