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Description

PPP-EFMDESCRIPTION POINTPROBE PLUS Silicon SPM Probe, silicon cantilever for Electrostatic Force Microscopy, detector side: Pt Ir coating tip side: Pt Ir coating

F - 6055 SDS (215KB PDF)

Immediately after installation of the EDX detector

The AuSome™ resolution and calibration standards consist of known and uniform gold particles on a silicon chip

not included

A pack of Silicon Nitride Probes

50 x 160 x 30mm H

460 - 530µm

The high nominal 40N/m spring constant is most suitable for stiff (typically GPa) samples

Convenient holder for clamping down samples up to a thickness of 7mm under the clamping strips

are non-magnetic and the tips do not open when extra pressure is applied

Heat resistant: continuous use at temperatures up to 150°C (302°F)

The compact

Exchange/Return Notes

We offer a 30-day return/exchange service after receiving.
Final sale items are not eligible for returns or exchanges.
To process your return/exchange, please contact us at [email protected]
Please click here for more details>>> Return & Exchange Policy

Shipping Notes

Free Standard Shipping on $100+ Orders to the USA.
Except Preorder products are shipped in 48 hours.
Delivery to the USA:

Standard Shipping : 3-10 business days

If time is of the essence, please consider selecting expedited delivery for faster service.

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