SEM Magnification Standard and Stage Micrometer MRS-4 - Specimen Mounts

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SEM Magnification Standard and Stage Micrometer MRS-4 - Specimen MountsDESCRIPTION Mounting MRS 3 4 Retainer on 1" (25. 4mm) Pin Stub with a 1 8" (3. 2mm) pin, for #614 5 only Mounting MRS 3 4 Retainer on Hitachi 25x10mmxM4 Cylinder Mount, for #614 5 only The 10x to 200,000x standard for Scanning Electron Microscopy with 1 2, 1, 2, 50 and 500m pitch patterns and X & Y Micro ruler Selected MRS 4 Patterns in Greater Detail Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB and TEM (with special version)

specially formulated adhesive for demanding bonding applications such as:

- Quantity=1

Prod # Description Style Length Metal Points - Width x Thickness 5367-5G PELCO® Pro Gold Plated Straight

The plastic tubes in which the discs are packaged may be inserted into the PELCO® Diskpenser

Period: 145nm pitch nominal

Tipless cantilevers for Contact Mode or Fluid TappingMode imaging and force measurement with a variety of extremely low spring constants for high force sensitivity

Structure: Si wafer with grating in top surface Pattern type: Array of sharp tips Tip angle: About 50 degrees Tip Radius: ≤10nm Tip Height: 0

Veco Center Reference with Cut Off and Center Box

The wide rims (350-400µm) on the PELCO® Grids provide additional stiffness and minimize the potential of interfering with the sample when picking up and handling the grids with tweezers

65 Cantilever Thickness (RNG): 0

Punch circles from raw materials

These O-rings are identical to FCO-10 except constructed of fluorosilicone rubber

Exchange/Return Notes