SEM Magnification Standard and Stage Micrometer MRS-4 - Adapters

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Description

SEM Magnification Standard and Stage Micrometer MRS-4 - AdaptersDESCRIPTION Adapter MRS 3 4 only, specify AMRAY, Leica Optical Microscope Adapter OM R 1. 75" x 1" x 0. 125" thick (44. 5 x 25. 4 x 3. 2mm) with clear hole for transmission measurements. Standard slightly recessed 0. 005" (0. 13mm), aluminum, Ni plated The 10x to 200,000x standard for Scanning Electron Microscopy with 1 2, 1, 2, 50 and 500m pitch patterns and X & Y Micro ruler Selected MRS 4 Patterns in Greater Detail Applications Electron microscopy

Tip Geometry: Critical Dimension (Overhang) Tip Height: 10 - 15 Tip Radius (Max): <10 Tip Set Back (Nom): 15 Tip Set Back( RNG): 5 - 25 Tilt Compensation: 3

Max Effective Length = 1000 nm

PDMS Gel 2

5+/-5 Tip Radius (Nom): 40 Tip Coating: Highly conductive single cystal diamond Tip Set Back (Nom): 15-25 Tilt Compensation: 5 +/- 1

3mm copper TEM grid

The AFM/STM disks are 20 gauge which is 0

Gilder Triple Slot Grids

Built on the high-performance RTESP-150 AFM probe

It is a zinc sulfide window mounted on a magnetic sample puck with two different microtomed samples on it

5 65 41 - •

High quality probe manufactured by Bruker AFM Probes

It may also be used as a calibration specimen

Exchange/Return Notes