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Description

PELCO® Bar Clamp Vise, 4", 6" and 8"DESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain

High quality gold coated magnetic stainless steel (alloy 430) discs for Atomic Force Microscopy are offered with smooth edges and consistently flat surfaces

) Pen length with probe is 152mm

HMX probes are preferred over HMXS version probes for stiffer and sticky samples where the tip can get more easily stuck to the surface

Parameters are contained in the QR code on the box for fast and error free reading with the QR reader included with Bruker’s new PeakForce QNM high accuracy kit available for Dimension Icon

The fast drying nickel paint forms a thin

DualBeam and CrossBeam systems

force modulation microscopy

self lubricating properties and excellent wear and abrasion resistance

Width x Thickness 5373-NM PELCO Reverse

222® is not readily removed by many water based or oil based substances

*Note: Replaces previous part #MMMC

Preparing specimens requires a hot plate or heating block

Exchange/Return Notes